CHEM5210: Materials Characterization

4 Credits

Modern tools/techniques for both bulk- and thin-film characterization. Topics may include ion-solid interactions, Rutherford back scattering, secondary ion mass spectrometry, solid-state NMR, x-ray photoelectron spectroscopy, small-angle x-ray/neutron scattering, transmission/scanning electron/probe microscopy, near-field scanning optical microscopy, porosimetry, adsorption techniques, and ellipsometry. prereq: grad student or instr consent

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A- Average (3.775)Most Common: A (60%)

This total also includes data from semesters with unknown instructors.

190 students
SWFDCBA
  • 4.15

    /5

    Recommend
  • 4.35

    /5

    Effort
  • 4.26

    /5

    Understanding
  • 3.97

    /5

    Interesting
  • 3.78

    /5

    Activities


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