A basic introduction to electron microscopy (EM) methods and techniques for materials characterization. The course is intended for junior- and senior-level undergraduates and graduate students interested in obtaining a basic understanding of characterization with EM. Topics to be covered include an introduction to instrumentation, basics of scattering theory, and a survey of imaging, diffraction, and analytical measurement techniques. Current and emerging techniques will also be covered, including machine learning and big data for EM and time-resolved measurements. Students will research a specific topic of interest over the course of the semester, culminating in a project paper and a class presentation.