This course is an introduction to transmission electron microscopy (TEM) and materials characterization using TEM. Topics include description and operation of TEMs, electron sources, basics of electron optics, interaction of electrons with specimen, diffraction, imaging techniques, and microanalysis. The goal of this course is to enable you to understand the fundamentals of TEM and microanalysis, read the scientific literature and determine which TEM-based method would be best to solve the problem you encounter in your own research. In a process you will learn aboutinstrumentation, structure of materials, diffraction physics, optics, and condensed matter physics.